Expertise
Catalysts Characterisation
Surface Composition
XPS provides the average composition to a depth of 3nm or so plus chemical species. SIMS on the other hand identifies molecular species lifted off the outermost layer of the surface but is not quantitative. STEM analysis complements this when used to analyse the edge of particles of individual phases within a catalyst.
Advice is available, so make the call +44 (0) 1642 435788 or email MSGenquiry@intertek.com
Back to Catalysts Characterisation
